Objectifs

This course introduces the main methods involved in the surface analysis of material surfaces. It tackles questions on the chemistry and physics of the various approaches and discusses the advantages and shortcomings of a high number of methods including X-Ray Photoelectron Spectroscopy, Auger Electron Spectroscopy, Scanning Electron Microscopy, Secondary Ion Mass Spectrometry, Ion Scattering Spectroscopy, etc.

Cours
30h
 
TD
14h
 
TP
4h
 

Code

22_M_NSE_S3_MAJOR_2

Responsables

  • Bertrand VILQUIN
  • Yann CHEVOLOT

Langue

Anglais