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Objectifs

This course introduces the main methods involved in the surface analysis of material surfaces. It tackles questions on the chemistry and physics of the various approaches and discusses the advantages and shortcomings of a high number of methods including X-Ray Photoelectron Spectroscopy, Auger Electron Spectroscopy, Scanning Electron Microscopy, Secondary Ion Mass Spectrometry, Ion Scattering Spectroscopy, etc.

Modalité du contrôle des connaissances

Examen écrit final

Bibliographie

  • John C. Vickerman, Ian Gilmore, “Surface Analysis: The Principal Techniques”,, Wiley, 2009
  • John C. Rivière, Sverre Myhra, “Handbook of Surface and Interface Analysis: Methods for Problem-Solving”, CRC Press, 1998
  • David Briggs, M.P. Seah, “Practical Surface Analysis: Auger and X-ray Photoelectron Spectroscopy” (Volume 1), Wiley, 1990
Cours
30h
 
TD
14h
 
TP
3h
 

Code

24_M_NSE_S3_MAJOR_2

Responsables

  • Virginie MONNIER-VILLAUME
  • Magali PHANER GOUTORBE

Langue

Anglais