Objectifs

This course introduces the main methods involved in the surface analysis of material surfaces. It tackles questions on the chemistry and physics of the various approaches and discusses the advantages and shortcomings of a high number of methods including X-Ray Photoelectron Spectroscopy, Auger Electron Spectroscopy, Scanning Electron Microscopy, Secondary Ion Mass Spectrometry, Ion Scattering Spectroscopy, etc.

Cours
30h
 
TD
14h
 
TP
3h
 

Responsables

  • Virginie MONNIER-VILLAUME
  • Magali PHANER GOUTORBE

Langue

Anglais