Goals

This course introduces the main methods involved in the surface analysis of material surfaces. It tackles questions on the chemistry and physics of the various approaches and discusses the advantages and shortcomings of a high number of methods including X-Ray Photoelectron Spectroscopy, Auger Electron Spectroscopy, Scanning Electron Microscopy, Secondary Ion Mass Spectrometry, Ion Scattering Spectroscopy, etc.

Course
30h
 
TC
14h
 
PW
3h
 

Responsibles

  • Virginie MONNIER-VILLAUME
  • Magali PHANER GOUTORBE

Language

English