Observation and Analysis of Materials

The important progresses made in the field of "materials science" are strongly linked to the development of methods making possible the characterization of solid materials down to the microscale. Most of the analysis techniques are based on the interaction between probes (photon, electron, ion) and the matter. We will alternate a basic teaching on the physical concepts on which the main characterisation techniques of materials are based and a description of the principle and applications of the most commonly used techniques (XPS photoelectron spectroscopy, X-Ray Diffraction, electron and near field microscopy (STM, AFM)). The final objective is to give to the future engineer the keys to be able to choose the most appropriated technique(s) for his industrial problem.

• Introduction: Classification of the different interaction processes
• Photon-matter interaction
• Energy levels and IR spectroscopy
• X-ray diffraction technique
• XPS and IR techniques
• Ion / matter interaction
• RBS and SIMS techniques
• Electron / matter interaction
• Electron microscopy techniques (TEM / SEM)
• Electron spectroscopy techniques (EDX / EELS)
• Near field tunnel and AFM microscopies
• Visit of the LTDS + INL laboratory facilities (2h) and presentation of the problem for the autonomous work
• Autonomous work and presentation of the results